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Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits. This article possibly contains original research. Archived from the original on May 31, For example, a particular PLD integrated circuit may be packaged in different package sizes such as a pin package, pin package, pin package, pin package, or package with other number of pins. A programmable logic circuit comprising:. Cell selector method and apparatus for use in time division multiplexers and switches. In a specific embodiment, the A register and B register have 16 bits or storage elements per column. This technique may be used to implement test Functions in a programmable logic device.

  • High Performance Computing in Science and Engineering '11 SpringerLink
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  • USB1 Technique to test an integrated circuit using fewer pins Google Patents
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    High Performance Computing in Science and Engineering '11 SpringerLink

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    The demand dictated by multimedia computing has created a new arena for basic. covers uniformly XC, XC and XC series of Xilinx FPGAs.
    Archived from the original PDF on 14 December Scan testing digital logic with differing frequencies of system clock and test clock.

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    The programmable logic circuit of claim 5 wherein each of the first plurality of registers comprises a first clock line, and test data is serially shifted from the plurality of test pins to the first plurality of registers under control of a first clock signal on the first clock line. This digital system may be used in a wide variety of applications and industries including networking, telecommunications, automotives, control system, consumer electronic, computers, Workstations, military, industrial, digital processing, and many others.

    The programmable logic circuit of claim 6 wherein each of the second plurality of registers comprises a second clock line, and test data is transferred in parallel from the first plurality of registers to the second plurality of registers under control of a second clock signal on the second clock line. Processing unit may be a central processing unit CPUmicroprocessor, floating point coprocessor, graphics coprocessor, hardware controller, microcontroller, prgrammable logic device programmed for use as a controller, or other processing unit.

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    Retrieved 11 April It is intended that the scope of the invention be defined by the following claims.

    USB1 Technique to test an integrated circuit using fewer pins Google Patents

    It may take a slightly longer period of time to input or program a test pattern into the data register, but overall, this technique will still provide the same full test coverage and functionality of the device. Many columns may be input in parallel using a plurality of test pins. The programmable logic circuit of claim 18 wherein the clock input of the first register and the clock input of the second register couple to a first clock line.

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    ment of new models and for documentation of models that are subject to change. .

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    subject to C_limit: 0 XC ; (Frequent flyers will recog.
    It is intended that the scope of the invention be defined by the following claims. These registers are arranged in a serial chain, where each flip-flop stores a single bit of test data.

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    Many functions such as testing and configuration of an integrated circuit are performed using the external pins. There is a Q and QB output for flip-flop

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    Cyclic redundancy checking of a field programmable gate array having a SRAM memory architecture.

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    Efficient in-system programming structure and method for non-volatile programmable logic devices. The present invention is a technique of implementing functionality on an integrated circuit to facilitate downbonding of the integrated circuit into packages with fewer pins. Relevant discussion may be found on the talk page. A latch or D flip-flop may be used to implement each element in the registers.

    Comments (4)

    1. Zujinn

      Reply

      Further, a programmable logic device PLD is incorporated within this digital system.

    2. Dozil

      Reply

      The integrated circuit of claim 28 wherein each of the plurality of flip-flops in the second register is coupled to a FIFO chain in the plurality of column of logic block.